Journal

[42] The stability of oxide TFTs under electrical gate bias and monochromatic light illumination

Author

Soo-Yeon Lee, Sun-Jae Kim, Young-Wook Lee, Sang-geun Park, Jang-Yeon Kwon, and Min-Koo Han

Journal

ECS Transaction
ECS Trans.

Vol / Page / Year

33 / 313 / 2010

[41] Low Temperature Solution-Processed Zinc Tin Oxide Thin Film Transistor with O2 Plasma Treatment

Author

Jeong-Soo Lee, Yong-Jin Kim, Yong-Uk Lee, Seung-Hwan Cho, Yong-Hoon Kim, Jang-Yeon Kwon, and Min-Koo Han

Journal

ECS Transaction
ECS Trans.

Vol / Page / Year

33 / 283 / 2010

[40] The impact of gate dielectric materials on the light-induced bias instability in Hf-In-Zn-O thin film transistor

Author

Jang-Yeon Kwon, Ji Sim Jung, Kyoung Seok Son, Kwang-Hee Lee, Joon Seok Park, Tae Sang Kim, Jin-seong Park, Rino Choi, Jae Kyeong Jeong*, Bonwon Koo, and Sang Yoon Lee

Journal

Applied Physics Letters
Appl. Phys. Lett.

Vol / Page / Year

97 / 183503 / 2010

[39] High Performance and Stable Transparent Hf-In-Zn-O Thin Film Transistors with a Double-Etch-Stopper Layer

Author

Joon Seok Park, Kyoung Seok Son, Tae Sang Kim, Ji Sim Jung, Kwang-Hee Lee, Wan-Joo Maeng, Hyun-Suk Kim, Eok Su Kim, Kyung-Bae Park, Jong-Baek Seon, Jang-Yeon Kwon, Myung Kwan Ryu, and Sangyoon Lee

Journal

IEEE Electron Device Letters
IEEE Electron Device Lett.

Vol / Page / Year

31 / 1248 / 2010

[38] Ti/Cu bilayer electrodes for SiNx-passivated Hf-In-Zn-O thin film transistors: Device performance and contact resistance

Author

Joon Seok Park, Tae Sang Kim, Kyoung Seok Son, Eunha Lee, Ji Sim Jung, Kwang-Hee Lee, Wan-Joo Maeng, Hyun-Suk Kim, Eok Su Kim, Kyung-Bae Park, Jang-Yeon Kwon, Myung Kwan Ryu, and Sang Yoon Lee*

Journal

Applied Physics Letters
Appl. Phys. Lett.

Vol / Page / Year

97 / 162105 / 2010

[37] The Effect of Density-of-State on the Temperature and Gate Bias-Induced Instability of InGaZnO Thin Film Transistors

Author

Kwang Hwan Ji, Ji-In Kim, Hong Yoon Jung, Se Yeob Park, Yeon-Gon Mo, Jong Han Jeong, Jang-Yeon Kwon, Myung-Kwan Ryu, Sang Yoon Lee, Rino Choi, and Jae Kyeong Jeong*

Journal

Journal of The Electrochemical Society
J. Electrochem. Soc.

Vol / Page / Year

157 / H983 / 2010

[36] High Performance and Stability of Double-Gate Hf-In-Zn-O Thin-Film Transistors Under Illumination

Author

Joon Seok Park, Kyoung Seok Son, Tae Sang Kim, Ji Sim Jung, Kwang-Hee Lee, Wan-Joo Maeng, Hyun-Suk Kim, Eok Su Kim, Kyung-Bae Park, Jong-Baek Seon, Jang-Yeon Kwon, Myung Kwan Ryu, and Sangyun Lee

Journal

IEEE Electron Device Letters
IEEE Electron Device Lett.

Vol / Page / Year

31 / 960 / 2010

[35] The Effect of Passivation layers on the Negative Bias Instability of Ga-In-Zn-O Thin Film Transistors under Illumination

Author

Ji Sim Jung, Kwang-Hee Lee, Kyoung Seok Son, Joon Seok Park, Tae Sang Kim, Jong Hyun Seo, Jae-Hong Jeon, Mun-Pyo Hong, Jang-Yeon Kwon*, Bonwon Koo, and Sangyun Lee

Journal

Electrochemical and Solid-State Letters
Electrochem. Solid-State Lett.

Vol / Page / Year

13 / H376 / 2010

[34] Highly stable double-gate Ga-In-Zn-O thin film transistor

Author

Kyoung-Seok Son, Ji-Sim Jung, Kwang-Hee Lee, Tae-Sang Kim, Joon-Seok Park, KeeChan Park, Jang-Yeon Kwon*, Bonwon Koo, and Sang-Yoon Lee

Journal

IEEE Electron Device Letters
IEEE Electron Device Lett.

Vol / Page / Year

31 / 812 / 2010

[33] The impact of SiNx gate insulators on amorphous indium-gallium-zinc oxide thin film transistors under bias-temperature-illumination stress

Author

Ji Sim Jung, Kyoung Seok Son, Kwang-Hee Lee, Joon Seok Park, Tae Sang Kim, Jang-Yeon Kwon*, Kwun-Bum Chung, Jin-Seong Park*, Bonwon Koo, and Sangyun Lee

Journal

Applied Physics Letters
Appl. Phys. Lett.

Vol / Page / Year

96 / 193506 / 2010

[32] Influence of Illumination on the Negative-Bias Stability of Transparent Hafnium-Indium-Zinc Oxide Thin-Film Transistors

Author

Joon Seok Park, Tae Sang Kim, Kyoung Seok Son, Ji Sim Jung, Kwang-Hee Lee, Jang-Yeon Kwon, Bonwon Koo, and Sangyoon Lee

Journal

IEEE Electron Device Letters
IEEE Electron Device Lett.

Vol / Page / Year

31 / 440 / 2010

[31] The Impact of Device Configuration on the Photon-Enhanced Negative Bias Thermal Instability of GaInZnO Thin Film Transistors

Author

Jang-Yeon Kwon, Kyoung Seok Son, Ji Sim Jung, Kwang-Hee Lee, Joon Seok Park, Tae Sang Kim, Kwang Hwan Ji, Rino Choi, Jae Kyeong Jeong, Bonwon Koo, and Sangyun Lee*

Journal

Electrochemical and Solid-State Letters
Electrochem. Solid-State Lett.

Vol / Page / Year

13 / H213 / 2010

[30] Characteristics of Double-Gate Ga-In-Zn-O Thin-Film Transistor

Author

Kyoung-Seok Son, Ji-Sim Jung, Kwang-Hee Lee, Tae-Sang Kim, Joon-Seok Park, Yun-Hyuk Choi, KeeChan Park, Jang-Yeon Kwon, Bonwon Koo, and Sang-Yoon Lee

Journal

IEEE Electron Device Letters
IEEE Electron Device Lett.

Vol / Page / Year

31 / 219 / 2010

[29] A study on materials interactions between Mo electrode and InGaZnO active layer in InGaZnO-based thin film transistors

Author

Kyung Park, Chee-Hong An, Byung-Il Hwang, Hoo-Jeong Lee, Hyoungsub Kim*, Kyungseok Son, Jang-Yeon Kwon, and Sangyun Lee

Journal

Journal of Materials Research
J. Mater. Res.

Vol / Page / Year

25 / 266 / 2010